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专利名称：Burn-in substrate and burn-in device发明人：Kenichi Ol申请号：US10975015申请日：20041028
公开号：US20050116223A1公开日：20050602
专利附图：
摘要：Input and output of small-current signals between a mother board andsemiconductor devices subjected to a burn-in test are made via a device driving unit.Large-current main power is supplied via the device driving unit through bus bars withoutpassing through the mother board. In this way, the risk of burn-out in a burn-in substrateand burn-in sockets, and damages caused by a burn-out can be reduced even when itoccurs.
申请人：Kenichi Ol
地址：Osaka JP
国籍：JP
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