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专利名称：X-ray diffractometer
发明人：Howe, Stephen,Rogers, Donald申请号：EP87301859.2申请日：19870304公开号：EP0245923A2公开日：19871119
摘要：The invention comprises apparatus for determining the orientation of thecrystallographic axes of a single crystal (16). The crystal is rotatd on a turntable (14)while an X-ray beam containing characteristic radiation is directed onto it. A stationaryposition-sensitive detector (18), preferably positioned at right angles to the beamdetects Bragg reflections from the crystal, and computing means responsive to thesignals from the detector, and signals representing the angular position of the turntabledetermines the crystal orientation.
申请人：Howe, Stephen,Rogers, Donald
地址：13 D Venice Court 41 Conduit Road Hong Kong HK,11 Salvington CrescentBexhill-on-Sea East Sussex TN39 3NP GB
国籍：HK,GB
代理机构：Hartley, David
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